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Design of On-Wafer TRL Calibration Kit for InP Technologies Characterization up to 500 GHz

Type of publication Peer-reviewed
Publikationsform Original article (peer-reviewed)
Author Deng Marina, Mukherjee Chhandak, Yadav Chandan, Fregonese Sebastien, Zimmer Thomas, De Matos Magali, Quan Wei, Arabhavi Akshay Mahadev, Bolognesi Colombo R., Wen Xin, Luisier Mathieu, Raya Christian, Ardouin Bertrand, Maneux Cristell,
Project ULTIMATE: Upper Limit Technology Investigations Mandatory to Attain Terahertz Electronics
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Original article (peer-reviewed)

Journal IEEE Transactions on Electron Devices
Volume (Issue) 67(12)
Page(s) 5441 - 5447
Title of proceedings IEEE Transactions on Electron Devices
DOI 10.1109/ted.2020.3033834

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