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Reliability-Aware Circuit Design Methodology for Beyond-5G Communication Systems

Type of publication Peer-reviewed
Publikationsform Original article (peer-reviewed)
Author Mukherjee Chhandak, Ardouin Bertrand, Dupuy Jean-Yves, Nodjiadjim Virginie, Riet Muriel, Zimmer Thomas, Marc Francois, Maneux Cristell,
Project ULTIMATE: Upper Limit Technology Investigations Mandatory to Attain Terahertz Electronics
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Original article (peer-reviewed)

Journal IEEE Transactions on Device and Materials Reliability
Volume (Issue) 17(3)
Page(s) 490 - 506
Title of proceedings IEEE Transactions on Device and Materials Reliability
DOI 10.1109/tdmr.2017.2710303

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