This proposal is concerned with a high resolution x-ray diffractometer (HRXRD) that is especially designed for the structural analysis of thin films, multilayers, and nanoparticles. The system will be equiped with a cryostat and a furnace that enable measurements at variable temperatures between 25K and 1073K. Specifically, this instrument contains a high intensity micro-focus X-ray source providing a low divergence beam with a small spot size, a precise four-axis goniometer, a “Pilatus” 2D X-ray detector for efficient k-space mapping, and a cryostat and furnace.
This HRXRD setup will form the backbone of the research activities of a multidisciplinary team of five groups in the departments of Physics, Chemistry and Geoscience at the University of Fribourg (UniFr), and at the General Energy Research Department of the Paul-Scherrer-Institut (PSI) in Villigen. Their research topics cover a wide spectrum that ranges from oxide-based thin films and multilayers, over organic thin films, to antimicorbial implant coatings and atmospheric nanoparticles (aerosols). The HRXRD setup enables a detailed structural analysis of these various kinds of nanoscale materials. The HRXRD setup will be operated and supported by experienced scientists and engineers and will be well embedded into the infrastructure of the Fribourg Center for Nanomaterials (FriMat). Upon arrangment, the HRXRD system will also be available to other Swiss groups working on thin films and nanomaterials.