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Optical correction of X-Ray Laser Illumination for Short- wavelength Microscopy
Type of publication
Ruiz Mabel, Staub Felix, Bleiner Davide,
"ELAN" - EUV Laser for Actinic Nano-imaging.
Title of proceedings
Conference on X-ray Lasers
A critical aspect in the design of a short-wavelength microscope is the illumination profile and stability. Experimental measurements of the pointing sta- bility and divergence and optical corrections of X-ray laser source are shown. The optical corrections provided one order of magnitude improvement in the illumina- tion performance.