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Angle calculations for a (2+3)-type diffractometer: focus on area detectors

Type of publication Peer-reviewed
Publikationsform Original article (peer-reviewed)
Publication date 2011
Author Schleputz CM, Mariager SO, Pauli SA, Feidenhans'l R, Willmott PR,
Project Interfacial properties of perovskite thin films
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Original article (peer-reviewed)

Journal JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume (Issue) 44
Page(s) 73 - 83
Title of proceedings JOURNAL OF APPLIED CRYSTALLOGRAPHY

Abstract

Angle calculations for a (2+3)-type diffractometer are presented with comprehensive derivations for both cases of either a vertical or horizontal sample configuration. This work focuses on some particular aspects of using area detectors in surface X-ray diffraction, namely the role of the detector rotation and the direct conversion of the angle-resolved diffraction signal recorded by the detector into a two-dimensional slice through reciprocal space.
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