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Atomic imaging and direct phase retrieval using anomalous surface x-ray diffraction

Type of publication Peer-reviewed
Publikationsform Original article (peer-reviewed)
Publication date 2012
Author Pauli S. A., Leake S. J., Bjoerck M., Willmott P. R.,
Project Direct Methods Applied to Oxide Heterostructures
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Original article (peer-reviewed)

Journal JOURNAL OF PHYSICS-CONDENSED MATTER
Volume (Issue) 24(30)
Page(s) 305002:1 - 305002:7
Title of proceedings JOURNAL OF PHYSICS-CONDENSED MATTER
DOI 10.1088/0953

Open Access

URL http://iopscience.iop.org/0953-8984/24/30/305002
Type of Open Access Publisher (Gold Open Access)

Abstract

The application of multi-wavelength anomalous diffraction to thin films, interfaces and surface structures is presented. The method directly determines the amplitudes and phases of the complex surface structure factors from surface x-ray diffraction data, measured at three different energies around the absorption edge of one of the elements present in the film. Thereby, one is able to directly Fourier transform the data, which immediately provides meaningful and unambiguous electron-density distributions. These serve as a starting point for subsequent structural refinement. The robustness of the algorithm was evaluated on simulated data as a proof of principle. The experimental limitations and their effect on the method will be discussed as well as stability tests for the algorithm, such as the positions of the anomalous scatterers and the interfacial roughness. It will be shown that the method can be applied to real structures. The algorithm was tested on real data from a thin film of SrTiO3 grown on NdGaO3(110)
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