semiconductor industry; nanotechnology; nonscanning multiphoton polarimetric microscope; second-harmonic generation; crystal structure; microscopes market; multiphoton scanning laser microscope; per-pixel analysis; nonlinear optics; corrosion; nondestructive testing
Timofeeva Maria, Renaut Claude, Timpu Flavia, Shtrom Igor, Bouravleuv Alexey, Lang Lukas, Cirlin George, Grange Rachel (2018), III-V nanoantennas fabricated from nanowires for enhanced nonlinear optical signal at Mie resonances, in Nanophotonics
, Strasbourg, FranceSPIE, SPIE Photonics Europe.
Timofeeva Maria, Lang Lukas, Timpu Flavia, Renaut Claude, Bouravleuv Alexei, Shtrom Igor, Cirlin George, Grange Rachel (2018), Anapoles in Free-Standing III–V Nanodisks Enhancing Second-Harmonic Generation, in Nano Letters
, 18(6), 3695-3702.
The analysis of materials is a key element for quality control and properties characterization in medical, electronic and photonic industry. Currently, fluorescence imaging, electron microscopy and micro-photoluminescence studies are the most common tools for material analysis in research and industry areas. These methods require complex sample preparation and special environment conditions that limits their application and increases cost of analysis.I propose to use nonlinear optical responses of materials to avoid staining procedure for fluorescence imaging, ultrathin samples preparation for transmission electron microscopy, or low temperature environment for photoluminescence. Indeed, nonlinear optical microscopy used infrared light instead of visible light, allow for deep penetration due to less scattering and natural spectral filtering, since the detection is at different wavelength than the excitation. It is a very powerful technique for many biological samples and common materials for nanotechnology, such as III-V and II-VI semiconductors, perovskite and other materials with non-symmetric crystal structure. Moreover, nonlinear responses are strongly dependent on material properties, and can be a very effective feature to study their different characteristics. The potential of using nonlinear optical methods in material science is very high, but existing solutions are not convenient enough in terms of equipment, sample preparation and human resources costs.In this project, I will build a nonlinear microscope prototype PolarNon - composed of a cost-effective hardware and software solution for studying material properties by measuring polarization dependency of nonlinear responses without the need to scan the light as in current commercial systems. The PolarNon system does not require special sample preparation or measurement conditions, like low temperatures, vacuum or ultrathin substrates. The core of the proposed solution is my method of per-pixel analysis of images of polarized nonlinear responses to reconstruct the material crystalline properties down to the pixel resolution with one-click. I already successfully applied this approach to several material science problems for predicting samples inner structure. For instance, I applied it to precisely characterize crystal structures variations within single gallium arsenide nanowires. I believe that the proposed solution can be effectively applied in industry and research. To achieve that I will assemble a compact nonlinear microscope with automatized stages and enhance the software for the per-pixel analysis with a user-friendly interface. The Bridge program will help me to prepare the commercial prototype with hardware and software components, to analyse its commercial potential and to advertise it at conferences and exhibitions dedicated to photonic or material sciences.