Scanning tunneling microscopy; Tunneling spectroscopy; Atomic force microscopy; Spin polarized STM/AFM; Correlated electron systems; Metal-insulator phase transition; Ordered electronic phases; Low dimensional physics; Superconductivity; Scanning probe microscopy (SPM); Spin polarized STM
Novello A. M., Hildebrand B., Scarfato A., Didiot C., Monney G., Ubaldini A., Berger H., Bowler D. R., Aebi P., Renner Ch. (2015), Scanning tunneling microscopy of the charge density wave in 1T−TiSe2 in the presence of single atom defects, in Physical Review B
, 92(8), 081101-1-081101-4.
Hildebrand B., Didiot C., Novello A. M., Monney G., Scarfato A., Ubaldini A., Berger H., Bowler D. R., Renner C., Aebi P. (2014), Doping Nature of Native Defects in 1T−TiSe2, in Physical Review Letters
, 112(19), 197001-197001-5.
Ong Quy Khac, Reguera Javier, Silva Paulo Jacob, Moglianetti Mauro, Harkness Kellen, Longobardi Maria, Mali Kunal S., Renner Christoph, De Feyter Steven, Stellacci Francesco (2013), High-Resolution Scanning Tunneling Microscopy Characterization of Mixed Monolayer Protected Gold Nanoparticles, in ACS Nano
, 7(10), 8529-8539.
Biscarini Fabio, Ong Quy Khac, Albonetti Cristiano, Liscio Fabiola, Longobardi Maria, Mali Kunal S., Ciesielski Artur, Reguera Javier, Renner Christoph, De Feyter Steven, Samorì Paolo, Stellacci Francesco (2013), Quantitative Analysis of Scanning Tunneling Microscopy Images of Mixed-Ligand-Functionalized Nanoparticles, in Langmuir
, 29(45), 13723-13734.
Characterizing and understanding the next generation of electronic materials require increasingly sophisticated experimental techniques. Exploiting these materials in innovative 21st century applications relies on a profound knowledge of their properties, in particular electronic and magnetic. The scanning tunneling microscope (STM) is distinctively suited to yield such insight. Not only does STM provide atomic resolution images of surfaces, it can simultaneously measure their electronic and magnetic structures with equally fine spatial resolution. STM has become increasingly versatile with steadily improving performances to establish itself as a prime technique to examine electronic materials. Most remarkable progresses include spin sensitivity, momentum resolved tunneling spectroscopy and atom tracking temperature dependent measurements. These are all essential features to explore the magnetic field and temperature dependent phase diagrams of novel electronic compounds.One outstanding challenge is to explore electronic materials by STM in close proximity to insulating phases, both in real space and in phase space. The scientific objectives are multiple: i) study nanocrystals and devices embedded in insulating matrices, for example gated crystals and nanostructures, edge states, one dimensional systems, etc; ii) study regions in the phase diagram of correlated electron materials next to insulating phases. The latter is of fundamental importance to understand how correlated electron states form unconventional metals and superconductors out of insulating phases by doping or changing temperature, one of the most debated scientific issues in contemporary solid state physics. Safely driving an STM tip over any surface, independent of its metallic or insulating nature, can be achieved by combining STM with an atomic force microscope (AFM). Combining a fully functional STM with an AFM is delicate, especially not to undermine tunneling spectroscopy. The commercial instrument we are planning to procure is capable of regulating the tip position based on force feedback, in a broad magnetic field and temperature range, while maintaining the tip-to-sample separation stable enough to perform tunneling spectroscopy. Furthermore, it has unique characteristics to perform atomic scale spin sensitive STM and AFM. The outcome of the proposed new instrument will not only be of scientific significance, it will also contribute to the training of students and postdocs in a very modern and sophisticated experimental technique.