pulsed laser deposition (PLD); solid oxide fuel cell (SOFC)
Chen Jichun, Doebeli Max, Lee Michael, Conder Kazimierz, Schneider Christof W., Wokaun Alexander, Lippert Thomas (2016), Tracing the origin of oxygen for La0.6Sr0.4MnO3 thin film growth by pulsed laser deposition, in J. Phys. D: Appl. Phys.
, 49, 045201.
Stender Dieter, Frison R, Conder K., Rupp Jennifer L. M., Scherrer Barbara, Martynczuk J. M., Gauckler L. J., Schneider Christof W., Lippert Thomas, Wokaun Alexander (2015), Crystallization of zirconia based thin films, in Phys. Chem. Chem. Phys
, 17, 18613.
Stender Dieter, Schäuble Nina, Weidenkaff Anke, Montagne Alex, Ghisleni Rudy, Michler Johann, Schneider Christof W, Wokaun Alexander, Lippert Thomas (2015), Dense zig-zag microstructures in YSZ thin films by pulsed laser deposition, in APL Materials
, 3, 016104.
Evans Anna, Martynczuk Julia, Stender Dieter, Schneider Christof W, Lippert Thomas, Prestat Michel (2015), Low-Temperature Micro-Solid Oxide Fuel Cells with Partially Amorphous La0.6Sr0.4CoO3-δ Cathodes, in Adv. Energy Mater.
, 5, 1400747.
Chen Jikun, Stender Dieter, Pichler Markus, Doebeli Max, Pergolesi Daniele, Schneider Christof, Wokaun Alexander, Lippert Thomas (2015), Tracing the plasma interactions for pulsed reactive crossed-beam laser ablation, in J. Appl. Phys.
, 118, 165306.
Chen Jikun, Lunney J. G., Lippert Thomas, Ojeda-G-P Alejandro, Stender Dieter, Schneider Christof W, Wokaun Alexander (2014), Langmuir probe measurements and mass spectrometry of plasma plumes generated by laser ablation of La0.4Ca0.6MnO3, in J. Appl. Phys.
, 116, 073303.
Chen Jikun, Palla-Papavlu Alexandra, Li Yi, Chen L., Chi X., Doebeli Max, Stender Dieter, Populoh S., Xie W., Weidenkaff Anke, Schneider Christof W, Wokaun Alexander, Lippert Thomas (2014), Laser deposition and direct-writing of thermoelectric misfit cobaltite thin films, in Appl. Phys. Lett.
, 104, 231907.
Chen Jikun, Doebeli Max, Stender Dieter, Conder Kazimir, Wokaun Alexander, Schneider Christof W, Lippert Thomas (2014), Plasma interactions determine the composition in pulsed laser deposited thin films, in Appl. Phys. Lett.
, 105, 114104.
Stender Dieter, Heiroth Sebastian, Lippert Thomas, Wokaun Alexander (2013), A comparison between micro-Raman spectroscopy and SIMS of beveled surfaces for isotope depth profiling, in Solid State Ionics
, 253 , 185.
Chen Jikun, Stender Dieter, Bator Matthias, Schneider Christof w, Lippert Thomas, Wokuan Alexander (2013), Influence of an O2 background gas on the composition and kinetic energies of species in laser induced La0.4Ca0.6MnO3 plasmas, in Applied Surface Science
, 278 , 317.
Hu Y, Stender Dieter, Medarde M, Lippert Thomas, Wokaun Alexander, Schneider Christof W (2013), Lattice distortion and strain relaxation in epitaxial thin films of multiferroic TbMnO3 probed by X-ray diffractometry and micro-Raman spectroscopy, in Applied Surface Science
, 278 , 92.
Scherrer Barbara, Schlupp Meike V.F., Stender Dieter, Martynczuk Julia, Grolig Jan G., Ma Huan, Kocher Peter, Lippert Thomas, Prestat Michel, Gauckler Ludwig J. (2013), On Proton Conductivity in Porous and Dense Yttria Stabilized Zirconia at Low Temperature, in Adv. Funct. Mater.
, 23, 1957.
Stender Dieter, Cook Stuart, Kilner John A, Doebeli Max, Conder Kazimierz, Lippert Thomas, Wokaun Alexander (2013), SIMS of thin films grown by pulsed laser deposition on isotopically labeled substrates, in Solid State Ionics
, 249, 56.
Peláez R. J., Afonso C. N., Chen J., Esposito M., Lippert Thomas, Stender Dieter, Wokaun Alexander (2012), Relevance and formation mechanisms of negative ions upon ablation of Al2O3, in J. Phys. D. Appl. Phys.
, 45, 285402.
Chopdekar R. V., Malik V. K., Fraile Rodriguez A., Le Guyader L., Takamura Y., Scholl A., Stender D., Schneider C. W., Bernhard C., Nolting F., Heyderman L. J. (2012), Spatially resolved strain-imprinted magnetic states in an artificial multiferroic, in Phys. Rev. B
, 86, 014408.
Sub-µm thin films of oxygen-ion conductive materials are of interest as solid electrolyte in miniaturized high temperature electrochemical devices such as micro solid oxide fuel cells (SOFCs), solid oxide electrolysis cells (SOECs) and gas sensors. Due to a significant reduction of the ohmic resistance, the use of thin film technologies promises lower operational temperatures, an enhanced performance as well as an increased lifetime and wider eligible material range compared to traditional processing techniques. The fabrication as well as the analysis of the oxygen ion conduction in thin films of the ion conductors is challenging as cross-plane measurements are strongly influenced by holes, cracks, or voids in the films, grain boundaries, which serve as segregation centers for impurities, and short circuits created by metal migration especially along the grain boundaries. In addition, the influence of microstrain and varying degree of crystallinity from amorphous to nanocrystalline or mixed phases on the ionic conduction in these fluorite related structures is unclear. The application of single crystalline, i.e. perfect dense films, on conducting substrates is the most promising pathway to overcome these limitations. One intriguing approach is the deposition of single crystalline yttria stabilized zirconia (YSZ) on biaxially textured Ni substrates (with an intermediate CeO2 layer), which has been used for the deposition of superconducting YBCO tapes (RABiTS approach= rolling-assisted-biaxially-textured substrates). This highly developed system will be the starting point for the deposition of ion conduction films such as YSZ on conducting substrates. The ion conductivity will be determined by cross-plane conductivity measurements, with and without blocking electrodes and by ion exchange depth profiling (IEDP), where the isotopic oxygen exchange (18O2) and secondary ion mass spectrometry (SIMS) are used as methods. The application of depth profiling SIMS allows also to determine whether metal migration takes place and whether the formation of impurity segregations is present and how this influences the material properties. The metal migration will be tested by using intermediate layers with various thicknesses, while the role and importance of the impurities can be analyzed by using PLD targets with well-defined impurity contents. This requires also a certain control over the microstructure in the thin films, i.e. not only in the form of single crystalline films, which can be achieved by varying the deposition conditions, such as target temperature and deposition angle. As final step various ion-conducting materials will be deposited. This will allow to determine the “true” properties of the material that will be prepared without any influence of microstructures (voids etc.), impurity segregation sites, or metal migration pathways. In addition, the alternating deposition of YSZ layers with different size of unit cells, made by different Y content dopings, will create microstrain at the heteroepitaxial interfaces. Ionic conductivity measurements parallel to these strained interfaces would allow capturing the influence of microstain on ionic conductance for the first time